JEOL JSM-6701F Ultra High Resolution FE SEM Microscope.
QR Code Link to This Post
Year 2014, Clean condition, and working as per manufacturer specs.
The JSM-6701F is an ultra high resolution FE SEM suitable for observations of fine structures such as multi-layered film and nano particles fabricated by the nano technology. JEOL JSM-6701F SEM (field-emission) equipped with cold field emission electron source with magnification from 25 to 650,000 times and accelerating voltage from 0.5 kV to 30 kV. Secondary electron detectors, retractable backscattered electron detector and transmission electron detector are available.
Comes with the following:
Oxford X-Max 80 SDD detector
SM-34080 (LDD) Lower Detector (lower SEI detector, in addition to the standard in-lens detector)
SM-71510 Specimen exchange chamber type 1A
SM-74120 (LNT) Liquid Nitrogen Trap
SM-33010 (PVG) Penning Vacuum Gauge
SM-71520MSC ( motorized stage controller)
software, manuals, sampler holders
Oil Rotary Pump